Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 A method for the determination

A method for the determination of environmental stress cracking by means of a constant tensile load is specified in BS EN ISO 22088-2

b) to establish the performance limits of the system

Identifies key industry and market drivers

PD CEN/TR 15449-1 is the first part of the multiple series document that provides a reference model for a Spatial Data Infrastructure (SDI)

Manufacturer or maintainer of AI-ESTATE

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 A method for the determinationWhat is BS EN IEC 60749 13 Salt atmosphere test for semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749 13 is the 13th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. BS EN IEC 60749 13 is only