G09500 - SEMI G95 - 後工程における450mmウェーハ用テープフレームカセットのためのロードポートの機械的インタフェースの仕様 StdPbc-0225 The Test Method is applicable

The Test Method is applicable to both bulk and epitaxial silicon

This Standard includes the measuring

This Test Method is used to evaluate the silver plaiting quality on leadframe for process control and outgoing inspection at the supplier or by the user for incoming inspection for process control and outgoing inspection at the supplier or by the user for incoming inspection

Significance — Use of this Guide in communications between customers and vendors can reduce the errors caused by the current use of different nomenclatures for the same feature of a leadframe

• Process module and substrate process tracking state models for recipe execution

G09500 - SEMI G95 - 後工程における450mmウェーハ用テープフレームカセットのためのロードポートの機械的インタフェースの仕様 StdPbc-0225 The Test Method is applicableAssembly & Packaging Global Technical Committee201364global Audits and Reviews Subcommittee20136www. semiviews. org www. semi. org 450mm450TFC450TFC 450mm450TFC450TFC 450TFC PGVAGVOHT450TFC Referenced SEMI Standards SEMI G88 Specification for Tape Frame for 450 mm Wafer SEMI G92 Specification for Tape Frame Cassette for 450 mm Wafer